Industry 4.0 Solutions

Wafer Defect Inspection Equipment
Automated wafer defects detection & classification
4", 6", and 8" wafers
Macro inspection - ~100μm defects
4", 6", and 8" wafers
Macro inspection - ~100μm defects

Automated wafer defects detection & classification
4", 6", 8", 12" wafers
Modular design: Micro (~5μm defects) + Macro inspection - (~50μm defects)
4", 6", 8", 12" wafers
Modular design: Micro (~5μm defects) + Macro inspection - (~50μm defects)


AI-Enabled Solutions
AI Equipment Automation Process (AI-EAP)
Emulates human judgement and responseAutomates equipment operation
Rapidly connects equipment to server with AI

Autonomous Smart Detector (ASD)
Automates patrolling of any kindDetects any scenario
Navigation in ultra-dynamic environments

Tracking and traceability of parts
Customized hardware for different wafer forms
FOUPs, cassettes, reels, metal-frame wafers
Customized hardware for different wafer forms
FOUPs, cassettes, reels, metal-frame wafers

Industrial AR glasses solution
Remote collaboration, SOP, Facial/object recognition
Ultra-lightweight, low heat, safe design
Remote collaboration, SOP, Facial/object recognition
Ultra-lightweight, low heat, safe design


AI as a Service
Embed WaveLength AI in your systems
Process images of existing AOI equipment
Detect and Classify New Defects
Reduce AOI overhaul costs
Detect and Classify New Defects
Reduce AOI overhaul costs

Process images of existing AOI equipment
Improve performance accuracy to meet production requirement
Reduce false negatives/positives
Improve performance accuracy to meet production requirement
Reduce false negatives/positives
