SOLUTIONS

Wafer Defect Inspection Equipment

Automated wafer defects detection & classification
4", 6", and 8" wafers
Macro inspection - ~100μm defects

Automated wafer defects detection & classification
4", 6", 8", 12" wafers
Modular design: Micro (~5μm defects) + Macro inspection - (~50μm defects)

AI-Enabled Solutions

Emulates human judgement and response
Automates equipment operation
Rapidly connects equipment to server with AI

Automates patrolling of any kind
Detects any scenario
Navigation in ultra-dynamic environments

Tracking and traceability of parts
Customized hardware for different wafer forms
FOUPs, cassettes, reels, metal-frame wafers

Industrial AR glasses solution
Remote collaboration, SOP, Facial/object recognition
Ultra-lightweight, low heat, safe design

AI as a Service

Embed WaveLength AI in your systems

Process images of existing AOI equipment
Detect and Classify New Defects
Reduce AOI overhaul costs

Process images of existing AOI equipment
Improve performance accuracy to meet production requirement
Reduce false negatives/positives