Industry 4.0 Solutions
Wafer Defect Inspection Equipment

CV Series

Automated wafer defects detection & classification
4", 6", and 8" wafers
Macro inspection - ~100μm defects

DCA Series

Automated wafer defects detection & classification
4", 6", 8", 12" wafers
Modular design: Micro (~5μm defects) + Macro inspection - (~50μm defects)
AI-Enabled Solutions

AI Equipment Automation Process (AI-EAP)

Emulates human judgement and response
Automates equipment operation
Rapidly connects equipment to server with AI

Autonomous Smart Detector (ASD)

Automates patrolling of any kind
Detects any scenario
Navigation in ultra-dynamic environments

Smart Storage Systems

Tracking and traceability of parts
Customized hardware for different wafer forms
FOUPs, cassettes, reels, metal-frame wafers

InnoGlas

Industrial AR glasses solution
Remote collaboration, SOP, Facial/object recognition
Ultra-lightweight, low heat, safe design
AI as a Service
Embed WaveLength AI in your systems

Defects Detection

Process images of existing AOI equipment
Detect and Classify New Defects
Reduce AOI overhaul costs

Improve Accuracy

Process images of existing AOI equipment
Improve performance accuracy to meet production requirement
Reduce false negatives/positives